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Effects of deep placement of controlled-release nitrogen fertilizer on soybean growth and yield under sulfur deficiency

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journal contribution
posted on 2019-05-15, 10:40 authored by Minori Miyatake, Takuji Ohyama, Tadashi Yokoyama, Soh Sugihara, Takashi Motobayashi, Takehiro Kamiya, Toru Fujiwara, Kun Yuan, Sonoko Dorothea Bellingrath-Kimura, Naoko Ohkama-Ohtsu

Sulfur (S) and Nitrogen (N) metabolisms in plants are interacted and it is known that S deficiency decrease N absorption and metabolism. In leguminous plants S deficiency also decreases N2 fixation by rhizobia in the nodules. Deep placement of a controlled-release N fertilizer is a good method to provide nitrogen to soybean without inhibiting N2 fixation; thus, it was hypothesized that this method is able to provide nitrogen effectively to sulfur-deficient soybean plants. In this study effects of deep placement of coated urea on S-N physicological interaction, growth and productivity in soybean plants were examined using pot experiments. Soybean plants were grown with sulfate concentrations of 30, 100, or 1000 μM, with or without deep placement of coated urea. Shoot weights at the developing stage were not affected by S deficiency. SPAD values of leaves during the flowering stage decreased with S deficiency and increased with the deep placement of coated urea. S deficiency decreased seed weight per plant at the harvesting stage, but this decrease was attenuated by the deep placement of coated urea. N and S content in shoots at the developing stage increased with the deep placement of coated urea, whereas in seeds, only the N content increased. N2 fixation activity based on the relative ureide-N content in xylem sap indicated that the deep placement of coated urea did not inhibit N2 fixation activity at the early flowering stage. Without deep placement of coated urea, the relative ureide-N content decreased under S deficiency at the seed filling stage. These results suggest that the deep placement of coated urea is an efficient method to supply N to support soybean yield under S deficiency.

Abbreviations: Deep+: with deep placement of coated urea; Deep–: without deep placement of coated urea

Funding

This study was supported by the Japan Science and Technology Agency (JST), Strategic International Research Cooperative Program (SICORP), EIG CONCERT-Japan; Strategic International Collaborative Research Program [EIG CONCERT-Japan]

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    Soil Science and Plant Nutrition

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