Tin telluride (SnTe), a promising mid-temperature thermoelectric material, faces limitations due to inherent vacancies and band characteristics. Low-dimensionalization represents one avenue to potentially improve thermoelectric performance. This work explores the SnTe films with varying thicknesses (67–610 nm) and Zn doping concentration (0–12.81%) at high temperature. A 224 nm-SnTe-film exhibits optimal ZT values (0.27 at 600 K), and the Zn-doped films experience impaired thermoelectric properties, with the electrical conductivity reduction being a primary contributor. This study contributes valuable insights for enhancing thin-film SnTe's thermoelectric performance and developing eco-friendly mid-temperature thermoelectric materials.
Funding
This work was supported by the National Natural Science Foundation of China [51976025, 52327808], and the Fundamental Research Funds for the Central Universities [DUT22ZD216].