Taylor & Francis Group
Browse
1/1
6 files

Multiway Cluster Robust Double/Debiased Machine Learning

dataset
posted on 2021-03-03, 17:30 authored by Harold D. Chiang, Kengo Kato, Yukun Ma, Yuya Sasaki

This article investigates double/debiased machine learning (DML) under multiway clustered sampling environments. We propose a novel multiway cross-fitting algorithm and a multiway DML estimator based on this algorithm. We also develop a multiway cluster robust standard error formula. Simulations indicate that the proposed procedure has favorable finite sample performance. Applying the proposed method to market share data for demand analysis, we obtain larger two-way cluster robust standard errors for the price coefficient than nonrobust ones in the demand model.

Funding

H. Chiang’s research is supported by the Office of the Vice Chancellor for Research and Graduate Education at the University of Wisconsin-Madison with funding from the Wisconsin Alumni Research Foundation. K. Kato is partially supported by NSF grants DMS-1952306 and DMS-2014636.

History